Atomic structure of a thin silica film on a Mo(112) substrate: A two-dimensional network of SiO4 tetrahedra

Physical Review Letters

Volumn 95, Issue 7, 2005, Pages

  Weissenrieder, J ^a   Kaya, S ^a   Lu, J L ^a,b   Gao, H J ^b   Shaikhutdinov, S ^a   Freund, H J ^a   Sierka, M ^c   Todorova, T K ^c   Sauer, J ^c  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b INSTITUTE OF PHYSICS   (China)

^c HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY FUNCTIONAL THEORY; SIO4 TETRAHEDRA; TETRAHEDRON; THIN SILICA FILM;

CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH; INFRARED SPECTROSCOPY; MOLYBDENUM; PROBABILITY DENSITY FUNCTION; SCANNING TUNNELING MICROSCOPY; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

EID: 27144511145     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.076103     Document Type: Article

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