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Volumn , Issue , 2007, Pages 506-515

Mechanisms for bounding vulnerabilities of processor structures

Author keywords

Microarchitecture; Redundant threading; Transient faults

Indexed keywords

MICROARCHITECTURE; RELIABILITY BUDGETS; TRANSIENT ERRORS; VULNERABILITY REDUCTION;

EID: 35348914300     PISSN: 10636897     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1250662.1250725     Document Type: Conference Paper
Times cited : (48)

References (23)
  • 2
    • 84858364747 scopus 로고    scopus 로고
    • D. Burger and T. Austin. The SimpleScalar Toolset, Version 3.0
    • D. Burger and T. Austin. The SimpleScalar Toolset, Version 3.0. http://www.simplescalar.com.
  • 3
    • 0141837018 scopus 로고    scopus 로고
    • Trends and Challenges in VLSI Circuit Reliability
    • July-August
    • C. Constantinescu. Trends and Challenges in VLSI Circuit Reliability. IEEE Micro, 23(4): 14-19, July-August 2003.
    • (2003) IEEE Micro , vol.23 , Issue.4 , pp. 14-19
    • Constantinescu, C.1
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.