Characterizing microarchitecture soft error vulnerability phase behavior

Proceedings - IEEE Computer Society's Annual International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunications Systems, MASCOTS

Volumn , Issue , 2006, Pages 147-155

  Fu, Xin ^a   Poe, James ^a   Li, Tao ^a   Fortes, José A B ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COEFFICIENT OF VARIATION; FAULT-TOLERANT MECHANISM; OUT-OF-ORDER EXECUTION; PROGRAM RELIABILITIES; PROGRAM VULNERABILITY; RELIABILITY MEASUREMENTS; SUPERSCALAR PROCESSOR; TIME VARYING BEHAVIOR;

COMPUTER ARCHITECTURE; COMPUTER SIMULATION; ERROR CORRECTION; FAULT TOLERANT COMPUTER SYSTEMS; MICROPROCESSOR CHIPS; OPTIMIZATION; PHASE BEHAVIOR; RADIATION HARDENING; RECORDING INSTRUMENTS; RELIABILITY; TELECOMMUNICATION SYSTEMS; TRACKING (POSITION);

PROGRAM PROCESSORS;

EID: 84891462123     PISSN: 15267539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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