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Volumn 19, Issue 18, 2007, Pages 4442-4446

Comparison between first- and second-generation praseodymium precursors for the MOCVD synthesis of praseodymium aluminate thin films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHARACTERIZATION; CRYSTALLIZATION; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; PERMITTIVITY; PRASEODYMIUM COMPOUNDS;

EID: 34548827989     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm070706t     Document Type: Article
Times cited : (4)

References (32)
  • 22
    • 34548844992 scopus 로고    scopus 로고
    • Digest of Technical Papers; Institute of Electrical and Electronic Engineers: New York
    • a) Chin, A.; Liao, C. C.; Lu, C. H.; Chen, W. J.; Tsai, C. 2007 Symposium on VLSI Circuits: Digest of Technical Papers; Institute of Electrical and Electronic Engineers: New York, 2001; p 135.
    • (2001) 2007 Symposium on VLSI Circuits , pp. 135
    • Chin, A.1    Liao, C.C.2    Lu, C.H.3    Chen, W.J.4    Tsai, C.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.