Performance degradation of small silicon devices caused by long-range Coulomb interactions

Applied Physics Letters

Volumn 76, Issue 16, 2000, Pages 2277-2279

  Fischetti, M V ^a   Laux, S E ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001088148     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126320     Document Type: Article

References (23)

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