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Volumn 44, Issue 4 B, 2005, Pages 2428-2432
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Thermal stability and electrical properties of (La2O 3)1-x(Al2O3)x composite films
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Author keywords
Al 2O3; CET; Composite film; Dielectric constant; High k gate dielectric film; La2O3; Leakage current; Pulsed laser deposition
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Indexed keywords
LEAKAGE CURRENTS;
PERMITTIVITY;
PULSED LASER DEPOSITION;
RAPID THERMAL ANNEALING;
THERMODYNAMIC STABILITY;
X RAY PHOTOELECTRON SPECTROSCOPY;
AL2O3;
COMPOSITE FILMS;
HIGH-K GATE DIELECTRIC FILM;
LA2O3;
DIELECTRIC FILMS;
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EID: 21244469815
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/JJAP.44.2428 Document Type: Conference Paper |
Times cited : (20)
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References (19)
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