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Volumn 44, Issue 4 B, 2005, Pages 2428-2432

Thermal stability and electrical properties of (La2O 3)1-x(Al2O3)x composite films

Author keywords

Al 2O3; CET; Composite film; Dielectric constant; High k gate dielectric film; La2O3; Leakage current; Pulsed laser deposition

Indexed keywords

LEAKAGE CURRENTS; PERMITTIVITY; PULSED LASER DEPOSITION; RAPID THERMAL ANNEALING; THERMODYNAMIC STABILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 21244469815     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.2428     Document Type: Conference Paper
Times cited : (20)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.