From micro- to nanotransport properties in Pr 2O 3-based thin layers

Journal of Applied Physics

Volumn 98, Issue 4, 2005, Pages

  Fiorenza, P ^a,b   Lo Nigro, R ^a   Raineri, V ^a   Lombardo, S ^a   Toro, R G ^b   Malandrino, G ^b   Fragal I L ^b  

^a CNR   (Italy)

^b UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION MECHANISMS; DIELECTRIC STACKS; NANOTRANSPORT PROPERTIES; SCANNING CAPACITANCE MICROSCOPY (SCM);

APPROXIMATION THEORY; CAPACITANCE; CAPACITORS; CHEMICAL VAPOR DEPOSITION; DIELECTRIC MATERIALS; ELECTRIC FIELDS; ELECTRIC POTENTIAL;

PRASEODYMIUM COMPOUNDS;

EID: 25144480833     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2012514     Document Type: Article

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