Cathodoluminescence investigation of residual stress in Er 3+:YAlO3 thin films grown on (110) SrTiO3 substrate by metal-organic chemical vapor deposition

Journal of Physical Chemistry B

Volumn 110, Issue 47, 2006, Pages 23977-23981

  Toro, Roberta G ^a   Malandrino, Graziella ^a   Fragalà, Ignazio L ^a   Keshu, Wan ^b   Leto, Andrea ^b   Pezzotti, Giuseppe ^b  

^a UNIVERSITY OF CATANIA   (Italy)

^b KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHASE TRANSITIONS; RESIDUAL STRESSES; THIN FILMS; X RAY DIFFRACTION;

FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FEG-SEM); REFLECTION POINT; X-RAY DIFFRACTION PATTERNS;

CATHODOLUMINESCENCE;

EID: 33846114705     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp064396y     Document Type: Article

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