Latch susceptibility to transient faults and new hardening approach

IEEE Transactions on Computers

Volumn 56, Issue 9, 2007, Pages 1255-1268

  Omaña, Martin ^a   Rossi, Daniele ^a   Metra, Cecilia ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Hardened latch; Robust design; Soft errors; Static latch; Transient faults

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC INVERTERS; FEEDBACK; TRANSIENTS;

HARDENED LATCH; ROBUST DESIGN; SOFT ERRORS; STATIC LATCH; TRANSIENT FAULTS;

FLIP FLOP CIRCUITS;

EID: 34548206267     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2007.1070     Document Type: Article

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