Model for transient fault susceptibility of combinational circuits

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 20, Issue 5, 2004, Pages 501-509

  Omaña, Martin ^a   Rossi, Daniele ^a   Metra, Cecilia ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Alpha particle; Soft error; Transient fault; Transient fault modeling; Transient fault susceptibility

Indexed keywords

ATTENUATION; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ERROR ANALYSIS; FUNCTION EVALUATION; MATHEMATICAL MODELS; MICROELECTRONICS; PROBABILITY; TRANSIENTS;

ALPHA-PARTICLE; SOFT ERROR; TRANSIENT FAULT; TRANSIENT FAULT MODELING; TRANSIENT FAULT SUSCEPTIBILITY;

COMBINATORIAL CIRCUITS;

EID: 4944246483     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JETT.0000042514.37566.6d     Document Type: Article

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