Impact of scaling on soft-error rates in commercial microprocessors

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3100-3106

  Seifert, Norbert ^a   Zhu, Xiaowei ^b   Massengill, Lloyd W ^b  

^a HEWLETT PACKARD COMPANY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

Alpha particle; Core logic; Data path; Dynamic circuits; Error correction codes (ECC); Latch; Microprocessor; Neutron; SEE; Single event upset (SEU); Soft error; Soft error rate (SER)

Indexed keywords

ALPHA PARTICLES; BIT ERROR RATE; CHIP SCALE PACKAGES; ELECTRIC CHARGE; ERROR CORRECTION; FLIP CHIP DEVICES; NEUTRONS;

SOFT ERROR RATES (SER);

MICROPROCESSOR CHIPS;

EID: 0036956115     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805402     Document Type: Conference Paper

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