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Volumn , Issue , 2003, Pages 886-892

Novel Transient Fault Hardened Static Latch

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; ELECTRIC INVERTERS; TRANSIENTS;

EID: 0142153682     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (64)

References (16)
  • 3
    • 0020765547 scopus 로고
    • Collection of charge from alpha-particle tracks in silicon devices
    • C. M. Hsieh, P. C. Murley, and R. R. O'Brien. Collection of charge from alpha-particle tracks in silicon devices. IEEE Trans. on Electron Devices, ED-30:686 - 693, 1983.
    • (1983) IEEE Trans. on Electron Devices , vol.ED-30 , pp. 686-693
    • Hsieh, C.M.1    Murley, P.C.2    O'Brien, R.R.3
  • 4
    • 0022876515 scopus 로고
    • Cmos circuit design for the prevention of single event upset
    • October
    • S. Kang and D. Chu. Cmos circuit design for the prevention of single event upset. Proc. of IEEE Int. Conf. On Computer Design, pages 385 - 388, October 1986.
    • (1986) Proc. of IEEE Int. Conf. On Computer Design , pp. 385-388
    • Kang, S.1    Chu, D.2
  • 7
    • 0026953435 scopus 로고
    • An on-chip ecc for correcting soft errors in drams with trench capacitors
    • November
    • P. Mazunder. An on-chip ecc for correcting soft errors in drams with trench capacitors. IEEE Journal of Solid-State Circuits, 27:1623 - 1633, November 1992.
    • (1992) IEEE Journal of Solid-State Circuits , vol.27 , pp. 1623-1633
    • Mazunder, P.1
  • 8
    • 0020298427 scopus 로고
    • Collection of charge on junction nodes from ion tracks
    • December
    • G. C. Messenger. Collection of charge on junction nodes from ion tracks. IEEE Trans. Nucl. Sci., NS-29(6):2024 - 2031, December 1982.
    • (1982) IEEE Trans. Nucl. Sci. , vol.NS-29 , Issue.6 , pp. 2024-2031
    • Messenger, G.C.1
  • 9
    • 0000670599 scopus 로고
    • Methodology of Detection of Spurious Signals in VLSI Circuits
    • F. Moll and A. Rubio, Methodology of Detection of Spurious Signals in VLSI Circuits. In Proc. of Eur. Design and Test Conf., pages 491 - 496, 1993.
    • (1993) Proc. of Eur. Design and Test Conf. , pp. 491-496
    • Moll, F.1    Rubio, A.2
  • 10
    • 0033306968 scopus 로고    scopus 로고
    • Seu testing of a novel hardened register implemented using standard cmos technology
    • December
    • T. Monnier, F. M. Roche, J. Cosculluela, and R. Velazco. Seu testing of a novel hardened register implemented using standard cmos technology. IEEE Trans. Nucl. Sci., 46(6), December 1999.
    • (1999) IEEE Trans. Nucl. Sci. , vol.46 , Issue.6
    • Monnier, T.1    Roche, F.M.2    Cosculluela, J.3    Velazco, R.4
  • 12
    • 0032595356 scopus 로고    scopus 로고
    • Modeling of alpha-particle-induced soft error rate in dram
    • September
    • H. Shin. Modeling of alpha-particle-induced soft error rate in dram. IEEE Trans. on Electron Devices, 46(9), September 1999.
    • (1999) IEEE Trans. on Electron Devices , vol.46 , Issue.9
    • Shin, H.1
  • 13
    • 0033335620 scopus 로고    scopus 로고
    • Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems
    • June
    • Y. Tosaka, H. Kanata, T. Itakura, and S. Satoh. Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems. IEEE Trans. Nucl. Sci., 46(3), June 1999.
    • (1999) IEEE Trans. Nucl. Sci. , vol.46 , Issue.3
    • Tosaka, Y.1    Kanata, H.2    Itakura, T.3    Satoh, S.4
  • 16
    • 0026838205 scopus 로고
    • Simulation and analysis of transient faults in digital circuits
    • March
    • F. L. Yang and R. A. Saleh. Simulation and analysis of transient faults in digital circuits. IEEE J. of Solid State Circuit, 27(3):258 - 264, March 1992.
    • (1992) IEEE J. of Solid State Circuit , vol.27 , Issue.3 , pp. 258-264
    • Yang, F.L.1    Saleh, R.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.