Tutorial: soft errors induced by alpha particles

IEEE Transactions on Reliability

Volumn 45, Issue 2, 1996, Pages 174-179

  Leon Lantz, I I ^a,b  

^a ARMED FORCES INSTITUTE OF PATHOLOGY   (United States)

^b Dep't of Defense   (United States)

Author keywords

Alpha particle; Electronic device reliability; Radiation; Soft error

Indexed keywords

ELECTRONIC DEVICE RELIABILITY; PLASTIC ENCAPSULATED MICROCIRCUITS; SOFT ERRORS;

ALPHA PARTICLES; ELECTRONICS PACKAGING; ELECTRONS; ERRORS; FAILURE ANALYSIS; MICROELECTRONICS; POLONIUM; RANDOM ACCESS STORAGE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR STORAGE; THORIUM; URANIUM;

RELIABILITY;

EID: 0030166337     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.510798     Document Type: Article

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