DFT assisted built-in soft error resilience

Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

Volumn 2005, Issue , 2005, Pages 69-

  Mak, T M ^a   Mitra, Subhasish ^a   Zhang, Ming ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; DATA STORAGE EQUIPMENT; ERROR DETECTION; LOGIC DEVICES; PROBABILITY DENSITY FUNCTION; REDUNDANCY;

FAULT TOLERANCE TECHNIQUES; SOFT ERROR RESILIENCE; TIME REDUNDANCY; TRIPLE MODULAR REDUNDANCY;

MOS DEVICES;

EID: 33745501537     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.23     Document Type: Conference Paper

References (0)