Design for mitigation of single event effects

Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

Volumn 2005, Issue , 2005, Pages 95-96

  Nicolaidis, Michael ^a  

^a iRoC Technologies   (France)

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EID: 33745502185     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.20     Document Type: Conference Paper

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