Nuclear physics of cosmic ray interaction with semiconductor materials: Particle-induced soft errors from a physicist's perspective

IBM Journal of Research and Development

Volumn 40, Issue 1, 1996, Pages 91-108

  Tang, H H K ^{a,b,c,d,e,f,g,h,i,j}  

^a IBM MICROELECTRONICS   (United States)

^b KALAMAZOO COLLEGE   (United States)

^c YALE UNIVERSITY   (United States)

^d NATIONAL SCIENCE FOUNDATION   (United States)

^e UNIVERSITY OF COPENHAGEN   (Denmark)

^f MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^g TEXAS A AND M UNIVERSITY   (United States)

^h Physics Department

ⁱ IBM   (United States)

^j AMERICAN PHYSICAL SOCIETY   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COSMIC RAYS; DATABASE SYSTEMS; ELEMENTARY PARTICLES; ERRORS; HIGH ENERGY PHYSICS; MATHEMATICAL MODELS; MICROELECTRONICS; NUCLEAR PHYSICS; SEMICONDUCTOR MATERIALS;

COSMIC RAY INTERACTION; MUONS; PARTICLE INDUCED SOFT ERRORS; PIONS; SOFT ERROR RATE;

COMPUTER SIMULATION;

EID: 0029776929     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.401.0091     Document Type: Article

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