W2B and CrB2 diffusion barriers for Ni/Au contacts to p-GaN

Applied Physics Letters

Volumn 91, Issue 4, 2007, Pages

  Voss, L F ^a   Stafford, L ^a   Wright, J S ^a   Pearton, S J ^a   Ren, F ^a   Kravchenko, I I ^b  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^b University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CHROMIUM COMPOUNDS; CONTACT RESISTANCE; GALLIUM NITRIDE; THERMAL AGING; TUNGSTEN COMPOUNDS;

AUGER ELECTRON DEPTH PROFILES; INTERMIXING; NI/AU CONTACTS;

DIFFUSION BARRIERS;

EID: 34547431128     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2762280     Document Type: Article

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