Investigation of degradation for ohmic performance of oxidized Au/Ni/Mg-doped GaN

Applied Physics Letters

Volumn 82, Issue 17, 2003, Pages 2817-2819

  Lin, Yow Jon ^a   Li, Zhen Dao ^a   Hsu, Chou Wei ^a   Chien, Feng Tso ^a   Lee, Ching Ting ^b   Shao, Sheng Tien ^b   Chang, Hsing Cheng ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ELECTRON BEAMS; GOLD; LIGHT EMITTING DIODES; OHMIC CONTACTS; OXIDATION; X RAY PHOTOELECTRON SPECTROSCOPY;

SPECIFIC CONTACT RESISTANCE;

GALLIUM NITRIDE;

EID: 0037621670     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1569991     Document Type: Article

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