메뉴 건너뛰기




Volumn 101, Issue 11, 2007, Pages

Control of the gas phase and the surface reactions during the high rate synthesis of high quality microcrystalline silicon films: Effects of the source gas supply method and the substrate bias

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; DEPOSITION; MICROCRYSTALLINE SILICON; RELAXATION PROCESSES; SURFACE REACTIONS; SYNTHESIS (CHEMICAL);

EID: 34250662722     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2733739     Document Type: Article
Times cited : (17)

References (37)
  • 1
    • 0001619060 scopus 로고
    • 0038-1101 10.1016/0038-1101(68)90071-3
    • S. Veprek and V. Marecek, Solid-State Electron. 0038-1101 10.1016/0038-1101(68)90071-3 11, 683 (1968).
    • (1968) Solid-State Electron. , vol.11 , pp. 683
    • Veprek, S.1    Marecek, V.2
  • 7
    • 0016319435 scopus 로고    scopus 로고
    • 0022-3093 10.1016/0022-3093(74)90081-7
    • A. Matsuda, J. Non-Cryst. Solids 0022-3093 10.1016/0022-3093(74)90081-7 16, 365 (1998).
    • (1998) J. Non-Cryst. Solids , vol.16 , pp. 365
    • Matsuda, A.1
  • 8
    • 0037416582 scopus 로고    scopus 로고
    • 0040-6090 10.1016/S0040-6090(02)01173-2
    • R. Dewarrat and J. Robertson, Thin Solid Films 0040-6090 10.1016/S0040-6090(02)01173-2 427, 11 (2003).
    • (2003) Thin Solid Films , vol.427 , pp. 11
    • Dewarrat, R.1    Robertson, J.2
  • 11
    • 0032326576 scopus 로고    scopus 로고
    • 0734-2101 10.1116/1.581105
    • A. Matsuda, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.581105 16, 365 (1998).
    • (1998) J. Vac. Sci. Technol. A , vol.16 , pp. 365
    • Matsuda, A.1
  • 14
    • 0026120313 scopus 로고
    • 0039-6028 10.1016/0039-6028(91)90166-P
    • J. -L. Guizot, K. Nomoto, and A. Matsuda, Surf. Sci. 0039-6028 10.1016/0039-6028(91)90166-P 244, 22 (1991).
    • (1991) Surf. Sci. , vol.244 , pp. 22
    • Guizot, J.-L.1    Nomoto, K.2    Matsuda, A.3
  • 23
    • 0005306026 scopus 로고
    • 0021-8979 10.1063/1.349033
    • M. Fang and B. Drevillon, J. Appl. Phys. 0021-8979 10.1063/1.349033 70, 4894 (1991).
    • (1991) J. Appl. Phys. , vol.70 , pp. 4894
    • Fang, M.1    Drevillon, B.2
  • 28
    • 36449003793 scopus 로고
    • 0021-8979 10.1063/1.359413
    • M. S. Feng and C. W. Liang, J. Appl. Phys. 0021-8979 10.1063/1.359413 77, 4771 (1995).
    • (1995) J. Appl. Phys. , vol.77 , pp. 4771
    • Feng, M.S.1    Liang, C.W.2
  • 35
    • 33747603252 scopus 로고    scopus 로고
    • 0022-3727 10.1088/0022-3727/39/17/021
    • H. Jia, J. K. Saha, N. Ohse, and H. Shirai, J. Phys. D 0022-3727 10.1088/0022-3727/39/17/021 39 3844 (2006).
    • (2006) J. Phys. D , vol.39 , pp. 3844
    • Jia, H.1    Saha, J.K.2    Ohse, N.3    Shirai, H.4
  • 36
    • 13744253789 scopus 로고    scopus 로고
    • 0021-4922 10.1143/JJAP.43.7909
    • A. Matsuda, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.43.7909 43, 7909 (2004).
    • (2004) Jpn. J. Appl. Phys., Part 1 , vol.43 , pp. 7909
    • Matsuda, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.