Structural and ac electrical properties of oxidised La and La-Mn thin films grown on Si substrates

Materials Chemistry and Physics

Volumn 102, Issue 2-3, 2007, Pages 266-270

  Dakhel, A A ^a  

^a UNIVERSITY OF BAHRAIN   (Bahrain)

Author keywords

Dielectric phenomena; Insulating films; Lanthana; Lanthanum manganese oxide

Indexed keywords

DIELECTRIC PROPERTIES; LANTHANUM; MANGANESE; SILICON; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE HYDROXIDE COMPOUNDS; INSULATING FILMS; LANTHANA; LANTHANUM-MANGANESE OXIDE; X RAY FLUORESCENCE (XRF);

GRAIN GROWTH;

EID: 33847696945     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2007.01.002     Document Type: Article

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