Computer simulation of angle-resolved x-ray photoelectron spectroscopy measurements for the study of surface and interface roughnesses

Journal of Applied Physics

Volumn 100, Issue 10, 2006, Pages

  Oswald, S ^a   Oswald, F ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; COMPUTER SIMULATION; MEASUREMENT THEORY; NONDESTRUCTIVE EXAMINATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY (ARXPS); MODEL CALCULATIONS; SPATIAL RESOLUTION; SURFACE STRUCTURES;

SURFACE ROUGHNESS;

EID: 33845221686     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2386938     Document Type: Article

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