Information depth and the mean escape depth in Auger electron spectroscopy and x-ray photoelectron spectroscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 21, Issue 1, 2003, Pages 274-283

  Jablonski, A ^a   Powell, C J ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; AUGER ELECTRON SPECTROSCOPY; CALCULATIONS; COMPUTER SIMULATION; ELECTRON EMISSION; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; KINETIC THEORY; MONTE CARLO METHODS; NONLINEAR EQUATIONS; PHOTOIONIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPTH DISTRIBUTION FUNCTION; ELASTIC-ELECTRON SCATTERING; INFORMATION DEPTH; KINETIC BOLTZMANN EQUATION; MEAN ESCAPE DEPTH;

SURFACE MEASUREMENT;

EID: 0037263382     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1538370     Document Type: Article

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