Photoelectron signal simulation from textured samples covered by a thin film

Vacuum

Volumn 62, Issue 2-3, 2001, Pages 297-302

  Vutova, K ^a   Mladenov, G ^a   Tanaka, T ^b   Kawabata, K ^b  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

^b HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Mathematical model; Photoelectron shadowing effect; Textured sample surface; Thin film; X ray photoelectron spectra (XPS); XPS angular intensity distribution

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; SURFACE CHEMISTRY; SURFACE ROUGHNESS; TEXTURES; THIN FILMS;

PHOTOELECTRON SIGNAL SIMULATION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0035876224     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(01)00155-5     Document Type: Article

References (14)