The applicability of angle-resolved XPS to the characterization of clusters on surfaces

Surface Science

Volumn 536, Issue 1-3, 2003, Pages 139-144

  Piyakis, K N ^a   Yang, D Q ^a   Sacher, E ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Clusters; Copper; Monte Carlo simulations; X ray photoelectron spectroscopy

Indexed keywords

COMPUTER SIMULATION; COPPER; ELECTRIC INSULATORS; MONTE CARLO METHODS; PERMITTIVITY; SURFACE PHENOMENA; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER NANOCLUSTERS;

NANOSTRUCTURED MATERIALS;

EID: 0038696196     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00571-5     Document Type: Article

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