Interaction of micropipes with foreign polytype inclusions in SiC

Journal of Applied Physics

Volumn 100, Issue 9, 2006, Pages

  Gutkin, M Yu ^a   Sheinerman, A G ^a   Argunova, T S ^b,c   Yi, J M ^c   Kim, M U ^c   Je, J H ^c   Nagalyuk, S S ^b   Mokhov, E N ^b   Margaritondo, G ^d   Hwu, Y ^e  

^a INSTITUTE OF PROBLEMS OF MECHANICAL ENGINEERING   (Russian Federation)

^b IOFFE INSTITUTE   (Russian Federation)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

^d EPFL   (Switzerland)

^e INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; GRAIN BOUNDARIES; MATHEMATICAL MODELS; PHOTOLUMINESCENCE; RADIOGRAPHY; SCANNING ELECTRON MICROSCOPY;

INCLUSION BOUNDARIES; MICROPIPES; MICROPIPES AGGLOMERATES; POLYTYPE BOUNDARIES;

SILICON CARBIDE;

EID: 33751105216     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2359686     Document Type: Article

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