On the test quality evaluation of current testing techniques

Proceedings - 2005 IEEE International Workshop on Current and Defect Based Testing, DBT 2005

Volumn , Issue , 2005, Pages 16-22

  Thibeault, C ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

Current testing; Defect level; IDDQ; Test escape; Test quality; Threshold setting; Yield loss

Indexed keywords

DEFECTS; TESTING;

CURRENT TESTING; DEFECT LEVEL; TEST ESCAPE; TEST QUALITY; THRESHOLD SETTING; YIELD LOSS;

ELECTRIC CURRENT MEASUREMENT;

EID: 33749073200     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DBT.2005.1531296     Document Type: Conference Paper

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