On the comparison of Δ IDDQ and IDDQ testing

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1999, Pages 143-150

  Thibeault, C ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DECISION THEORY; INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; PROBABILITY; VECTORS;

CURRENT TESTING; DEEP SUBMICRON TECHNOLOGY; FALSE TEST DECISION;

INTEGRATED CIRCUIT TESTING;

EID: 0032682919     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (25)