Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 565-573

  Schuermyer, C ^a   Benware, B ^a   Cota, K ^a   Madge, R ^a   Daasch, R ^b   Ning, L ^b  

^a AGERE SYSTEMS   (United States)

^b PORTLAND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; ELECTRIC POTENTIAL;

QUIESCENT CURRENTS;

DESIGN FOR TESTABILITY;

EID: 0142246907     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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