On the potential of flush delay for characterization and test optimization

Proceedings - 2004 IEEE International Workshop on Current and Defect Based Testing, DBT 2004

Volumn , Issue , 2004, Pages 55-60

  Thibeault, C ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

Characterization; Flush Delay; Sematech Data; Test Optimization; Yield

Indexed keywords

FLUSH DELAY; SEMATECH DATA; TEST OPTIMIZATION; YIELD;

CHARACTERIZATION; CRYSTAL DEFECTS; DELAY CIRCUITS; GRAPH THEORY; OPTIMIZATION; SPECIFICATIONS; STATISTICAL METHODS;

INTEGRATED CIRCUIT TESTING;

EID: 21444434711     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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