On new current signatures and adaptive test technique combination

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 59-64

  Thibeault, C ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DETECTION; GAUSSAIN DISTRIBUTION; STANDARD DEVIATION; TEST TECHNIQUES;

APPROXIMATION THEORY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DEFECTS; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; PARAMETER ESTIMATION; RESISTORS; TRANSISTORS;

ELECTRON DEVICE TESTING;

EID: 3142685465     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299226     Document Type: Conference Paper

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