Process-tolerant test with energy consumption ratio

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1027-1036

  Vinnakota, Bapiraju ^a   Jiang, Wanli ^a   Sun, Dechang ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY CONSUMPTION RATIO (ECR);

ALGORITHMS; ELECTRIC FAULT LOCATION; ENERGY UTILIZATION;

INTEGRATED CIRCUIT TESTING;

EID: 0032320511     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743300     Document Type: Conference Paper

References (16)