Diagnosis method based on Δ Iddq probabilistic signatures: Experimental results

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1019-1026

  Thibeault, C ^a   Boisvert, L ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL CURRENT PROBABILISTIC SIGNATURES;

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; MAXIMUM LIKELIHOOD ESTIMATION; PROBABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0032314887     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743299     Document Type: Conference Paper

References (26)