Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images

Journal of Electron Microscopy

Volumn 49, Issue 6, 2000, Pages 753-759

  Yamazaki, Takashi ^a   Watanabe, Kazuto ^b   Rečnik, Aleksander ^c   Čeh, Miran ^c   Kawasaki, Masahiro ^d   Shiojiri, Makoto ^e,f  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

^c JO EF STEFAN INSTITUTE   (Slovenia)

^d JEOL LTD   (Japan)

^e KANAZAWA MEDICAL UNIVERSITY   (Japan)

^f KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Bethe method; HAADF STEM; High resolution image; SrTiO3; ZnO

Indexed keywords

ATOMS; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; SCANNING ELECTRON MICROSCOPY; STRONTIUM TITANATES; TITANIUM COMPOUNDS; ZINC OXIDE;

ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; ATOMIC COLUMNS; ATOMIC SCALE; BEINE METHOD; HIGH-ANGLE ANNULAR DARK FIELD-STEIVL ZNO; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-RESOLUTION IMAGES; IMAGES SIMULATIONS; STEM IMAGES; TRANSMISSION ELECTRON MICROSCOPY IMAGES;

PROBES;

EID: 0034471310     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023868     Document Type: Article

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