Atomic-resolution imaging of lattice imperfections in semiconductors by combined aberration-corrected HRTEM and exit-plane wavefunction retrieval

Philosophical Magazine

Volumn 86, Issue 29-31, 2006, Pages 4589-4606

  Tillmann, K ^a   Houben, L ^a   Thust, A ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; DISLOCATIONS (CRYSTALS); GALLIUM NITRIDE; IMAGING TECHNIQUES; INTERFACES (MATERIALS); SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

FRANK PARTIAL DISLOCATIONS; HETEROINTERFACES; LOMER DISLOCATIONS; NUMERICAL RETRIEVAL;

CRYSTAL DEFECTS;

EID: 33746906717     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430600675763     Document Type: Article

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