Multiple beam tilt microscopy for super resolved imaging

Journal of Electron Microscopy

Volumn 46, Issue 1, 1997, Pages 11-22

  Kirkland, A I ^a,b   Saxton, W O ^a   Chand, G ^a  

^a Department of Chemistry ^*  (United Kingdom)

^b Silver Court Watchmead Welwyn Garden City   (United Kingdom)

Author keywords

image reconstruction; super resolution

Indexed keywords

AMORPHOUS MATERIALS;

IMAGES REGISTRATION; KEYWORD SUPER RESOLUTION, IMAGE RECONSTRUCTION; MATERIALS MODIFICATION; MULTIPLE BEAM; STANDARD PROCEDURES; SUPER RESOLVED IMAGING; SUPER-RESOLUTION IMAGE RECONSTRUCTION; THIN CRYSTAL;

IMAGE RECONSTRUCTION;

EID: 0030968518     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023486     Document Type: Article

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