Memory test experiment: Industrial results and data

IEE Proceedings: Computers and Digital Techniques

Volumn 153, Issue 1, 2006, Pages 1-8

  Hamdioui, S ^a   Van De Goor, Ad J ^a   Delos Reyes, J ^b   Rodgers, M ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; MATHEMATICAL MODELS; THEOREM PROVING;

MICRON TECHNOLOGY; PRIMITIVE-BASED MEMORY; VOLTAGE LEVEL;

ALGORITHMS;

EID: 33645512590     PISSN: 13502387     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cdt:20050104     Document Type: Article

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