False write through and un-restored write electrical level fault models for SRAMs

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn , Issue , 1997, Pages 27-32

  Adams, R Dean ^a   Cooley, Edmond S ^a  

^a DARTMOUTH COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS;

ELECTRICAL LEVEL FAULT MODELS; FALSE WRITE THROUGH FAULT MODELS; STATIC RANDOM ACCESS MEMORY (SRAM); UNRESTORED WRITE FAULT MODELS;

RANDOM ACCESS STORAGE;

EID: 0030649559     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)