March iC-: An improved version of March C- for ADOFs detection

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2004, Pages 129-134

  Dilillo, L ^a   Girard, P ^a   Pravossoudovitch, S ^a   Virazel, A ^a   Borri, S ^b  

^a LIRMM   (France)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADDRESS DECODER OPEN FAULTS (ADOF); DATA SEQUENCES; SENSITIZATION; STATIC COUPLING;

ALGORITHMS; AUTOMATIC TESTING; AUTOMATION; COMPUTER SIMULATION; DATA ACQUISITION; DEGREES OF FREEDOM (MECHANICS); DYNAMIC RANDOM ACCESS STORAGE; ELECTRIC FAULT CURRENTS; NAND CIRCUITS; STATIC RANDOM ACCESS STORAGE;

DETECTOR CIRCUITS;

EID: 3142719164     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2004.1299236     Document Type: Conference Paper

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