Detection of CMOS address decoder open faults with march and pseudo random memory tests

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 53-62

  Otterstedt, J ^a   Niggemeyer, D ^a   Williams, T W ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PSEUDO RANDOM MEMORY TESTS;

BUILT-IN SELF TEST; CMOS INTEGRATED CIRCUITS; DECODING; FAILURE ANALYSIS; RANDOM ACCESS STORAGE; RANDOM PROCESSES;

INTEGRATED CIRCUIT TESTING;

EID: 0032312595     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743137     Document Type: Conference Paper

References (23)