Static and dynamic behavior of memory cell array spot defects in embedded drams

IEEE Transactions on Computers

Volumn 52, Issue 3, 2003, Pages 293-309

  Al Ars, Zaid ^a   Van de Goor, Ad J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Defect simulation; Dynamic faulty behavior; Embedded DRAM; Fault primitives; Functional fault models; Spot defects

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SIMULATION; INTEGRATED CIRCUIT MANUFACTURE; STORAGE ALLOCATION (COMPUTER);

MEMORY CELL ARRAYS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0037340134     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2003.1183945     Document Type: Article

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