March SS: A test for all static simple RAM faults

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn 2002-January, Issue , 2002, Pages 95-100

  Hamdioui, S ^a,b   Van De Goor, A J ^b   Rodgers, M ^a  

^a INTEL CORPORATION   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Circuit faults; Circuit testing; Costs; Coupling circuits; Electrical fault detection; Fault detection; Random access memory; Read write memory; Semiconductor device testing; Ultra large scale integration

Indexed keywords

COSTS; COUPLED CIRCUITS; ELECTRIC FAULT LOCATION; FAULT DETECTION; INTEGRATION TESTING; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES; STATIC RANDOM ACCESS STORAGE; ULSI CIRCUITS;

CIRCUIT FAULTS; CIRCUIT TESTING; ELECTRICAL FAULT DETECTIONS; FAULT MODEL; MARCH TESTS; RANDOM ACCESS MEMORY; TEST LENGTHS;

RANDOM ACCESS STORAGE;

EID: 84892556191     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.2002.1029769     Document Type: Conference Paper

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