Memory testing under different stress conditions: An industrial evaluation

Proceedings -Design, Automation and Test in Europe, DATE '05

Volumn I, Issue , 2005, Pages 438-443

  Majhi, Ananta K ^a   Azimane, Mohamed ^a   Gronthoud, Guido ^a   Lousberg, Maurice ^a   Eichenberger, Stefan ^b   Bowen, Fred ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT-PER-MILLION (DPM); EMBEDDED MEMORIES; INDUCTIVE FAULT ANALYSIS (IFA); PRODUCT QUALITY;

ALGORITHMS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRONIC EQUIPMENT TESTING; MICROPROCESSOR CHIPS; SEMICONDUCTOR MATERIALS; STORAGE ALLOCATION (COMPUTER);

CMOS INTEGRATED CIRCUITS;

EID: 33645512489     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.206     Document Type: Conference Paper

References (14)

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