-
1
-
-
0020811741
-
Functional testing of semiconductor random access memories
-
M.S. Abadir and J.K. Reghbati, "Functional Testing of Semiconductor Random Access Memories," ACM Computer Surveys, 15(3), pp. 175-198, 1983.
-
(1983)
ACM Computer Surveys
, vol.15
, Issue.3
, pp. 175-198
-
-
Abadir, M.S.1
Reghbati, J.K.2
-
2
-
-
0003234909
-
Analysis of a deceptive read destructive memory fault model and recommended testing
-
R.D. Adams and E.S. Cooley, "Analysis of a Deceptive Read Destructive Memory Fault Model and Recommended Testing," in Proc. IEEE North Atlantic Test Workshop, 1996.
-
(1996)
Proc. IEEE North Atlantic Test Workshop
-
-
Adams, R.D.1
Cooley, E.S.2
-
3
-
-
0034503704
-
Impact of memory cell array bridges on the faulty behavior in embedded DRAMs
-
Z. Al-Ars and Ad J. van de Goor, "Impact of Memory Cell Array Bridges on the Faulty Behavior in Embedded DRAMs," in Proc. Asian Test Symp., pp. 282-289, 2000.
-
(2000)
Proc. Asian Test Symp.
, pp. 282-289
-
-
Al-Ars, Z.1
Van De Goor, A.J.2
-
4
-
-
0025442736
-
A realistic fault model and test algorithm for static random access memories
-
R. Dekker, F. Beenaker, and L. Thijssen, " A Realistic Fault Model and Test Algorithm for Static Random Access Memories," in IEEE Trans. on CAD, vol.9, no. 6, pp. 567-572, 1990.
-
(1990)
IEEE Trans. on CAD
, vol.9
, Issue.6
, pp. 567-572
-
-
Dekker, R.1
Beenaker, F.2
Thijssen, L.3
-
5
-
-
0034505514
-
Experimental analysis of spot defects in SRAMs: Realistic fault models and tests
-
S. Hamdioui and A.J. van de Goor, "Experimental Analysis of Spot Defects in SRAMs: Realistic Fault Models and Tests," in Proc. Asian Test Symp., pp. 131-138, 2000.
-
(2000)
Proc. Asian Test Symp.
, pp. 131-138
-
-
Hamdioui, S.1
Van De Goor, A.J.2
-
6
-
-
0033331049
-
On comparing functional fault coverage and defect coverage for memory testing
-
V.-K. Kim and T. Chen, "On Comparing Functional Fault Coverage and Defect Coverage for Memory Testing," in IEEE Trans. on CAD, vol. 18, no. 11, pp. 1676-1683, 1999.
-
(1999)
IEEE Trans. on CAD
, vol.18
, Issue.11
, pp. 1676-1683
-
-
Kim, V.-K.1
Chen, T.2
-
7
-
-
0020278451
-
Simple and efficient algorithms for functional RAM testing
-
M. Marinescu, "Simple and Efficient Algorithms for Functional RAM Testing," in Proc. IEEE Int'l Test Conf., pp. 236-239, 1982.
-
(1982)
Proc. IEEE Int'l Test Conf.
, pp. 236-239
-
-
Marinescu, M.1
-
8
-
-
0022012145
-
An improved method for detecting functional faults in semiconductor random access memories
-
C.A. Papachristou and N.B. Saghal, "An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories," in IEEE Trans. on Computers, vol. C-34, no. 2, pp. 110-116, 1985.
-
(1985)
IEEE Trans. on Computers
, vol.C34
, Issue.2
, pp. 110-116
-
-
Papachristou, C.A.1
Saghal, N.B.2
-
9
-
-
0033750078
-
Functional fault models: A formal notation and taxonomy
-
A.J. van de Goor and Z. Al-Ars, "Functional Fault Models: A Formal Notation and Taxonomy," in Proc. IEEE VLSI Test Symp., pp. 281-289, 2000.
-
(2000)
Proc. IEEE VLSI Test Symp.
, pp. 281-289
-
-
Van De Goor, A.J.1
Al-Ars, Z.2
-
11
-
-
0029712826
-
March LR: A test for realistic linked faults
-
A.J. van de Goor, et. al., "March LR: A Test for Realistic Linked Faults," in Proc. IEEE VLSI Test Symp., pp. 272-280, 1996.
-
(1996)
Proc. IEEE VLSI Test Symp.
, pp. 272-280
-
-
Van De Goor, A.J.1
|