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Volumn 2003-January, Issue , 2003, Pages 33-39

A fault primitive based analysis of linked faults in RAMs

Author keywords

Fault primitives; Functional fault models; Linked faults; March tests; Memory testing

Indexed keywords

TESTING;

EID: 33645509946     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.2003.1222358     Document Type: Conference Paper
Times cited : (7)

References (11)
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  • 2
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  • 3
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    • Z. Al-Ars and Ad J. van de Goor, "Impact of Memory Cell Array Bridges on the Faulty Behavior in Embedded DRAMs," in Proc. Asian Test Symp., pp. 282-289, 2000.
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    • Al-Ars, Z.1    Van De Goor, A.J.2
  • 4
    • 0025442736 scopus 로고
    • A realistic fault model and test algorithm for static random access memories
    • R. Dekker, F. Beenaker, and L. Thijssen, " A Realistic Fault Model and Test Algorithm for Static Random Access Memories," in IEEE Trans. on CAD, vol.9, no. 6, pp. 567-572, 1990.
    • (1990) IEEE Trans. on CAD , vol.9 , Issue.6 , pp. 567-572
    • Dekker, R.1    Beenaker, F.2    Thijssen, L.3
  • 5
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    • Experimental analysis of spot defects in SRAMs: Realistic fault models and tests
    • S. Hamdioui and A.J. van de Goor, "Experimental Analysis of Spot Defects in SRAMs: Realistic Fault Models and Tests," in Proc. Asian Test Symp., pp. 131-138, 2000.
    • (2000) Proc. Asian Test Symp. , pp. 131-138
    • Hamdioui, S.1    Van De Goor, A.J.2
  • 6
    • 0033331049 scopus 로고    scopus 로고
    • On comparing functional fault coverage and defect coverage for memory testing
    • V.-K. Kim and T. Chen, "On Comparing Functional Fault Coverage and Defect Coverage for Memory Testing," in IEEE Trans. on CAD, vol. 18, no. 11, pp. 1676-1683, 1999.
    • (1999) IEEE Trans. on CAD , vol.18 , Issue.11 , pp. 1676-1683
    • Kim, V.-K.1    Chen, T.2
  • 7
    • 0020278451 scopus 로고
    • Simple and efficient algorithms for functional RAM testing
    • M. Marinescu, "Simple and Efficient Algorithms for Functional RAM Testing," in Proc. IEEE Int'l Test Conf., pp. 236-239, 1982.
    • (1982) Proc. IEEE Int'l Test Conf. , pp. 236-239
    • Marinescu, M.1
  • 8
    • 0022012145 scopus 로고
    • An improved method for detecting functional faults in semiconductor random access memories
    • C.A. Papachristou and N.B. Saghal, "An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories," in IEEE Trans. on Computers, vol. C-34, no. 2, pp. 110-116, 1985.
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  • 9
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    • Functional fault models: A formal notation and taxonomy
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    • (2000) Proc. IEEE VLSI Test Symp. , pp. 281-289
    • Van De Goor, A.J.1    Al-Ars, Z.2
  • 11
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    • March LR: A test for realistic linked faults
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.