Defect-oriented dynamic fault models for embedded-SRAMs

Proceedings of the European Test Workshop

Volumn 2003-January, Issue , 2003, Pages 23-28

  Borri, S ^a   Hage Hassan, M ^a,b   Girard, P ^c   Pravossoudovitch, S ^c   Virazel, A ^c  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b UNIV MONTPELLIER   (France)

^c LIRMM   (France)

Author keywords

Clocks; Decoding; Delay; Electrical fault detection; Fault detection; Fault diagnosis; Random access memory; Robots; Testing; Timing

Indexed keywords

CLOCKS; DECODING; DEFECTS; ELECTRIC FAULT LOCATION; FAILURE ANALYSIS; RANDOM ACCESS STORAGE; ROBOTS; STATIC RANDOM ACCESS STORAGE; TESTING;

DELAY; DYNAMIC FAULT MODEL; ELECTRICAL FAULT DETECTIONS; ELECTRICAL SIMULATION; OPERATING CONDITION; RANDOM ACCESS MEMORY; RESISTANCE VALUES; TIMING;

FAULT DETECTION;

EID: 48049116295     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2003.1231664     Document Type: Conference Paper

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