Implementation of pseudo-random memory tests on commercial memory testers

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 226-235

  van de Goor, Ad J ^a   Lin, Mike ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

PROBABILITY; RANDOM ACCESS STORAGE;

MEMORY TESTERS; PSEUDO RANDOM MEMORY TESTS;

INTEGRATED CIRCUIT TESTING;

EID: 0031382116     PISSN: 10893539     EISSN: None     Source Type: None    
DOI: 10.1109/TEST.1997.639618     Document Type: Conference Paper

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