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Volumn 48, Issue 9, 2004, Pages 1569-1577

Silicon carbide TUNNETT diodes

Author keywords

Microwave diode; Silicon carbide; Transit time; TUNNET

Indexed keywords

CHARGE CARRIERS; ELECTRIC BREAKDOWN; IMPATT DIODES; IONIZATION; MICROWAVES; POWER AMPLIFIERS; SILICON CARBIDE;

EID: 2942702384     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.03.004     Document Type: Conference Paper
Times cited : (4)

References (37)
  • 1
    • 2942751791 scopus 로고
    • Multiple uniform layer approximation in analysis of negative resistance in p-n junction in breakdown
    • Misawa T. Multiple uniform layer approximation in analysis of negative resistance in p-n junction in breakdown. IEEE Trans. Electron. Dev. 14(9):1967;795-801.
    • (1967) IEEE Trans. Electron. Dev. , vol.14 , Issue.9 , pp. 795-801
    • Misawa, T.1
  • 2
    • 2942701712 scopus 로고
    • On tunnel-transit-time diode output characteristics
    • Aladinsky V.K., Gradinov P.G. On tunnel-transit-time diode output characteristics. Russ. J. Radioeng. Electron. 17(2):1972;376-380.
    • (1972) Russ. J. Radioeng. Electron. , vol.17 , Issue.2 , pp. 376-380
    • Aladinsky, V.K.1    Gradinov, P.G.2
  • 4
    • 0015967691 scopus 로고
    • Field-injection transit-time diodes with negative dynamic impedance
    • in Russian
    • Tager A.S. Field-injection transit-time diodes with negative dynamic impedance. Izv. VUZ-ov Radioelectron. 17:1974;3-18. (in Russian).
    • (1974) Izv. VUZ-ov Radioelectron. , vol.17 , pp. 3-18
    • Tager, A.S.1
  • 7
    • 0001610983 scopus 로고
    • Microwave and millimeter-wave power generation in silicon carbide avalanche devices
    • Mehdi I., Haddad G.I., Mains R.K. Microwave and millimeter-wave power generation in silicon carbide avalanche devices. J. Appl. Phys. 64(3):1988;1533-1540.
    • (1988) J. Appl. Phys. , vol.64 , Issue.3 , pp. 1533-1540
    • Mehdi, I.1    Haddad, G.I.2    Mains, R.K.3
  • 8
    • 0033080013 scopus 로고    scopus 로고
    • Microwave characteristics of BARITT diodes based on silicon carbide
    • Aroutiounian V.M., Buniatyan V.V., Soukiassian P. Microwave characteristics of BARITT diodes based on silicon carbide. Solid-State Electron. 43(3):1999;343-346.
    • (1999) Solid-state Electron. , vol.43 , Issue.3 , pp. 343-346
    • Aroutiounian, V.M.1    Buniatyan, V.V.2    Soukiassian, P.3
  • 10
    • 0022107255 scopus 로고
    • A unified treatment of the impedance of transit-time devices
    • Yeh S. A unified treatment of the impedance of transit-time devices. IEEE Trans. Electron. Dev. 28(3):1985;117-124.
    • (1985) IEEE Trans. Electron. Dev. , vol.28 , Issue.3 , pp. 117-124
    • Yeh, S.1
  • 12
    • 0030268828 scopus 로고    scopus 로고
    • Status of silicon carbide as a wide-bandgap semiconductor for high-temperature applications
    • Casady J.B., Johnson R.W. Status of silicon carbide as a wide-bandgap semiconductor for high-temperature applications. Solid-State Electron. 39(1):1996;1409-1422.
    • (1996) Solid-state Electron. , vol.39 , Issue.1 , pp. 1409-1422
    • Casady, J.B.1    Johnson, R.W.2
  • 13
    • 0030270893 scopus 로고    scopus 로고
    • Trends in power semiconductor devices
    • Baliga B.J. Trends in power semiconductor devices. IEEE Trans. Electron. Dev. 43(10):1996;1717-1731.
    • (1996) IEEE Trans. Electron. Dev. , vol.43 , Issue.10 , pp. 1717-1731
    • Baliga, B.J.1
  • 15
    • 0027575928 scopus 로고
    • Electrical and optical characterization of SiC
    • Pensl G., Choyke W.I. Electrical and optical characterization of SiC. Physica B. 185:1993;264-283.
    • (1993) Physica B , vol.185 , pp. 264-283
    • Pensl, G.1    Choyke, W.I.2
  • 16
    • 24844443050 scopus 로고    scopus 로고
    • Hole and electron effective masses in 6H-SiC studied by optically detected cyclotron resonance
    • Son N.T., Hallin C., Janzen E. Hole and electron effective masses in 6H-SiC studied by optically detected cyclotron resonance. Mater. Sci. Forum. 389-393:2002;525-528.
    • (2002) Mater. Sci. Forum , vol.389-393 , pp. 525-528
    • Son, N.T.1    Hallin, C.2    Janzen, E.3
  • 18
    • 0031186813 scopus 로고    scopus 로고
    • Analysis of Schottky barrier heights of metal/SiC contacts and its possible applications to high-voltage rectifying devices
    • Itoh A., Matsunami H. Analysis of Schottky barrier heights of metal/SiC contacts and its possible applications to high-voltage rectifying devices. Phys. Stat.-Sol. (a). 162:1997;389-408.
    • (1997) Phys. Stat.-sol. (a) , vol.162 , pp. 389-408
    • Itoh, A.1    Matsunami, H.2
  • 20
    • 0343442324 scopus 로고    scopus 로고
    • Monte Carlo simulation of 4H-SiC IMPATT diodes
    • Gruzinskis V., Luo Y., Zhao J., et al. Monte Carlo simulation of 4H-SiC IMPATT diodes. Mater. Sci. Forum. 338-342:2002;1379-1382.
    • (2002) Mater. Sci. Forum , vol.338-342 , pp. 1379-1382
    • Gruzinskis, V.1    Luo, Y.2    Zhao, J.3
  • 21
    • 84861453763 scopus 로고    scopus 로고
    • Direct and trap-assisted elastic tunneling through ultrathin gate oxides
    • Molions F.J., Gamiz F., Palma A., et al. Direct and trap-assisted elastic tunneling through ultrathin gate oxides. J. Appl. Phys. 91(8):2002;5116-5124.
    • (2002) J. Appl. Phys. , vol.91 , Issue.8 , pp. 5116-5124
    • Molions, F.J.1    Gamiz, F.2    Palma, A.3
  • 22
    • 0036470297 scopus 로고    scopus 로고
    • Theory of direct tunneling current in metal-oxide-semiconductor structures
    • Clerc R., Spinelli A., Ghibaudo G., Pananakakis G. Theory of direct tunneling current in metal-oxide-semiconductor structures. J. Appl. Phys. 91(3):2002;1400-1409.
    • (2002) J. Appl. Phys. , vol.91 , Issue.3 , pp. 1400-1409
    • Clerc, R.1    Spinelli, A.2    Ghibaudo, G.3    Pananakakis, G.4
  • 24
    • 0036642954 scopus 로고    scopus 로고
    • High-frequency operation potential of the tunnel emitter transistor
    • Aderstedt E., Lundgren P. High-frequency operation potential of the tunnel emitter transistor. Solid-State Electron. 46:2002;1033-1037.
    • (2002) Solid-state Electron. , vol.46 , pp. 1033-1037
    • Aderstedt, E.1    Lundgren, P.2
  • 25
    • 0942272813 scopus 로고    scopus 로고
    • Hole resonant through SiC/Si-dot/SiC heterostructures
    • Ikoma Y., Uchiyama K., Watanabe F., Motooka T. Hole resonant through SiC/Si-dot/SiC heterostructures. Mater. Sci. Forum. 389-393:2002;751-754.
    • (2002) Mater. Sci. Forum , vol.389-393 , pp. 751-754
    • Ikoma, Y.1    Uchiyama, K.2    Watanabe, F.3    Motooka, T.4
  • 26
    • 2942699815 scopus 로고    scopus 로고
    • P-3C-SiC/n-6H-SiC heterojunctions: Structural and electrical characterization
    • Lebedev A.A., Strelchuk A.M., Davidov D.V., et al. P-3C-SiC/n-6H-SiC heterojunctions: structural and electrical characterization. Mater. Sci. Forum. 389-393:2002;683-686.
    • (2002) Mater. Sci. Forum , vol.389-393 , pp. 683-686
    • Lebedev, A.A.1    Strelchuk, A.M.2    Davidov, D.V.3
  • 27
    • 0035766433 scopus 로고    scopus 로고
    • Small signal analysis of quantum-well BARITT diodes based on silicon carbide
    • Aroutiounian V.M., Buniatyan V.V., Soukiassian P. Small signal analysis of quantum-well BARITT diodes based on silicon carbide. Proc. SPIE. 4499:2001;160-166.
    • (2001) Proc. SPIE , vol.4499 , pp. 160-166
    • Aroutiounian, V.M.1    Buniatyan, V.V.2    Soukiassian, P.3
  • 28
    • 2942716623 scopus 로고    scopus 로고
    • Microwave characteristics of BARITT diodes with non-uniform distribution of traps concentration in transit-time region
    • Buniatyan V.V., Aroutiounian V.M. Microwave characteristics of BARITT diodes with non-uniform distribution of traps concentration in transit-time region. J. Appl. Electromag. Athens. 1(3):1998;1-11.
    • (1998) J. Appl. Electromag. Athens , vol.1 , Issue.3 , pp. 1-11
    • Buniatyan, V.V.1    Aroutiounian, V.M.2
  • 29
    • 0010943985 scopus 로고    scopus 로고
    • Influence of a profile of the distribution of impurities in a injecting layer and transit region on the Microwave characteristics of BARITT diodes
    • December 10-13, VIM, USA
    • Aroutiounian VM, Buniatyan VV. Influence of a profile of the distribution of impurities in a injecting layer and transit region on the Microwave characteristics of BARITT diodes. In: Proceedings of ISDRS, December 10-13, VIM, USA;1997. p. 187-90.
    • (1997) Proceedings of ISDRS , pp. 187-190
    • Aroutiounian, V.M.1    Buniatyan, V.V.2
  • 32
    • 0023998755 scopus 로고
    • The influence of transit-time effects on the optimum design and maximum oscillation frequency of quantum well oscillators
    • Kesan V.P., Neikirk D.P., Blakey P.A., et al. The influence of transit-time effects on the optimum design and maximum oscillation frequency of quantum well oscillators. IEEE Trans. Electron. Dev. 35:1988;405-413.
    • (1988) IEEE Trans. Electron. Dev. , vol.35 , pp. 405-413
    • Kesan, V.P.1    Neikirk, D.P.2    Blakey, P.A.3
  • 33
    • 0024124421 scopus 로고
    • Analysis and simulation of the quantum well injection transit-time diode
    • Song I., Dee-Son Pan Analysis and simulation of the quantum well injection transit-time diode. IEEE Trans. Electron. Dev. 35:1988;2315-2321.
    • (1988) IEEE Trans. Electron. Dev. , vol.35 , pp. 2315-2321
    • Song, I.1    Dee-Son, P.2
  • 36
    • 12944251052 scopus 로고    scopus 로고
    • Improved measurements of high-field drift velocity in silicon carbide
    • Khan I.A., James A. Cooper Jr. Improved measurements of high-field drift velocity in silicon carbide. Mater. Sci. Forum. 338-342:2000;761-764.
    • (2000) Mater. Sci. Forum , vol.338-342 , pp. 761-764
    • Khan, I.A.1    James Jr., A.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.