Theory of direct tunneling current in metal-oxide-semiconductor structures

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 1400-1409

  Clerc, R ^a   Spinelli, A ^a   Ghibaudo, G ^a   Pananakakis, G ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BARDEEN'S APPROACH; BASIC PRINCIPLES; DIRECT TUNNELING CURRENTS; METAL OXIDE SEMICONDUCTOR STRUCTURES; METAL-OXIDE; MOS STRUCTURE; PHYSICAL APPROACHES; QUANTIZATION EFFECTS; RESONANT TRANSFER;

TRANSFER MATRIX METHOD;

DIELECTRIC DEVICES;

EID: 0036470297     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1427398     Document Type: Article

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