Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope

Journal of Electron Microscopy

Volumn 53, Issue 2, 2004, Pages 163-168

  Morita, Seizo ^a   Sugimoto, Yoshiaki ^a   Oyabu, Noriaki ^a   Nishi, Ryuji ^a   Custance, Óscar ^a   Sugawara, Yasuhiro ^a   Abe, Masayuki ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atom manipulation; Atom selective imaging; Distinction of atom species; Mechanical atom manipulation; Non contact atomic force microscope

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; OXYGEN; SILICON;

ATOM MANIPULATION; ATOM-SELECTIVE IMAGING; ATOMIC FORCE; DISTINCTION OF ATOM SPECIES; MECHANICAL ATOM MANIPULATION; NON-CONTACT; NON-CONTACT ATOMIC FORCE MICROSCOPE; SELECTIVE IMAGING; SI(1 1 1)-7 × 7; SI(111)7×7;

ADATOMS;

EID: 2442476357     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/53.2.163     Document Type: Conference Paper

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