Atomically resolved imaging of Si(100)2 × 1, 2 × 1:H and 1 × 1:2H surfaces with noncontact atomic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 7 B, 2002, Pages 4857-4862

  Morita, Seizo ^a,b   Sugawara, Yasuhiro ^a,b  

^a Handai Frontier Research Center   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Atomic force microscope (AFM); Atomic resolution; Noncontact; Noncontact atomic force microscope (NC AFM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; DIMERS; IMAGE RECONSTRUCTION; PHASE TRANSITIONS;

IMAGE PATTERNS; NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

IMAGING TECHNIQUES;

EID: 0036657424     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.4857     Document Type: Conference Paper

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