Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 406-410

  Morita, Seizo ^a   Sugawara, Yasuhiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

61.16Ch; 68.35.Bs; 68.35.Dv; APN; Atomic force microscope; Noncontact; Resolution; True atomic resolution

Indexed keywords

EID: 0001584583     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00563-7     Document Type: Article

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